Wednesday May 23 (but really, just the entire show!) should not be missed if you are a test engineer or focus on testing in your position. This day is dedicated to different types of testing, including non-destructive and environmental. Want to make the most of this day? Ensure to keep the itinerary below at hand!
Testing Product Showcases
Start your day off with getting a good grasp of all the different testing capabilities our exhibitors offer through the Product Showcase:
- 10.30am: NDT Imaging Technology Update by Steve Jeffs, NDT Specialist at Dürr NDT – booth 5012
- 11:00am: Radiation Test Challenges for Integrated Circuits (ICs) & Advanced ICT Test Solutions by David Sleeter, VP Development at JD Instruments – booth 6013
- 12:00pm: The ObserVR1000, a Portable Data Acquisition and Analyzer by John Holler, Applications Engineer, Vibration Research – booth 8024
Testing Afternoon at the Open Tech Forum
The afternoon of Wednesday May 23 entirely focuses on two types of testing: non-destructive and environmental. Come and join us after the lunch break to hear the following presentations:
- 1:50pm: Practical Use of Particle Impact Dampers to Attenuate Vibration in Printed Circuit Boards by Martin Hart, President & CEO, TOPLINE Corporation
- 2:10pm: High-G Vibration and SRS Shock Testing by Gerrit Lane, Dynamics Engineer at Experior Laboratories, Inc.
- 2:30pm: Electromagnetic Interference Testing for Satellite Electronics and Electrical Systems by Jeffrey Viel, Chief Electrical Engineer at NTS
- 3:35pm: A New Method of PSD Estimation by John Holler, Applications Engineer at Vibration Research
Join us for the Engineer’s Breakfast!
Want to meet and network with your industry peers and colleagues over a relaxing, complimentary breakfast? Join us for the Engineer’s Breakfast on Thursday morning May 24 between 9:00am and 10:00am in the exhibition hall.
Meet Future Partners on the Exhibition Floor
There are many exhibitors on the show floor who focus on testing. Find below the location of exhibitors who you may want to meet: